Ключевое слово: «automated data processing»

This work is devoted to the investigation of the Schottky barrier at metal-two-dimensional semiconductor interfaces based on molybdenum disulfide synthesized by chemical vapor deposition. The relevance of the study is determined by the need for accurate evaluation of contact parameters that critically affect the performance of nanoelectronics devices. The object of the research is mono and few-layer MoS2 films with silver contacts. The aim of the work is to develop and validate a software-based algorithm for automated extraction of activation energy and Schottky barrier height from temperature-dependent current measurements. The proposed approach includes statistical processing of Arrhenius data, uncertainty estimation, confidence interval evaluation, and automatic outlier detection. In contrast to conventional manual analysis, the developed method ensures reproducibility, improves the reliability of the extracted parameters, and reduces subjective bias in the interpretation of experimental results.